]> bbs.cooldavid.org Git - net-next-2.6.git/blame - drivers/mtd/onenand/onenand_bbt.c
[MTD] OneNAND: Single bit error detection
[net-next-2.6.git] / drivers / mtd / onenand / onenand_bbt.c
CommitLineData
87590e26
KP
1/*
2 * linux/drivers/mtd/onenand/onenand_bbt.c
3 *
4 * Bad Block Table support for the OneNAND driver
5 *
6 * Copyright(c) 2005 Samsung Electronics
7 * Kyungmin Park <kyungmin.park@samsung.com>
8 *
9 * Derived from nand_bbt.c
10 *
11 * TODO:
12 * Split BBT core and chip specific BBT.
13 */
14
15#include <linux/slab.h>
16#include <linux/mtd/mtd.h>
17#include <linux/mtd/onenand.h>
18#include <linux/mtd/compatmac.h>
19
8593fbc6
TG
20extern int onenand_do_read_oob(struct mtd_info *mtd, loff_t from, size_t len,
21 size_t *retlen, u_char *buf);
22
87590e26
KP
23/**
24 * check_short_pattern - [GENERIC] check if a pattern is in the buffer
25 * @param buf the buffer to search
26 * @param len the length of buffer to search
27 * @param paglen the pagelength
28 * @param td search pattern descriptor
29 *
30 * Check for a pattern at the given place. Used to search bad block
31 * tables and good / bad block identifiers. Same as check_pattern, but
32 * no optional empty check and the pattern is expected to start
33 * at offset 0.
34 *
35 */
36static int check_short_pattern(uint8_t *buf, int len, int paglen, struct nand_bbt_descr *td)
37{
38 int i;
39 uint8_t *p = buf;
40
41 /* Compare the pattern */
42 for (i = 0; i < td->len; i++) {
43 if (p[i] != td->pattern[i])
44 return -1;
45 }
46 return 0;
47}
48
49/**
50 * create_bbt - [GENERIC] Create a bad block table by scanning the device
51 * @param mtd MTD device structure
52 * @param buf temporary buffer
53 * @param bd descriptor for the good/bad block search pattern
54 * @param chip create the table for a specific chip, -1 read all chips.
55 * Applies only if NAND_BBT_PERCHIP option is set
56 *
57 * Create a bad block table by scanning the device
58 * for the given good/bad block identify pattern
59 */
60static int create_bbt(struct mtd_info *mtd, uint8_t *buf, struct nand_bbt_descr *bd, int chip)
61{
62 struct onenand_chip *this = mtd->priv;
63 struct bbm_info *bbm = this->bbm;
64 int i, j, numblocks, len, scanlen;
65 int startblock;
66 loff_t from;
67 size_t readlen, ooblen;
68
69 printk(KERN_INFO "Scanning device for bad blocks\n");
70
71 len = 1;
72
73 /* We need only read few bytes from the OOB area */
74 scanlen = ooblen = 0;
75 readlen = bd->len;
76
77 /* chip == -1 case only */
78 /* Note that numblocks is 2 * (real numblocks) here;
79 * see i += 2 below as it makses shifting and masking less painful
80 */
81 numblocks = mtd->size >> (bbm->bbt_erase_shift - 1);
82 startblock = 0;
83 from = 0;
84
85 for (i = startblock; i < numblocks; ) {
86 int ret;
87
88 for (j = 0; j < len; j++) {
89 size_t retlen;
90
91 /* No need to read pages fully,
92 * just read required OOB bytes */
8593fbc6
TG
93 ret = onenand_do_read_oob(mtd, from + j * mtd->writesize + bd->offs,
94 readlen, &retlen, &buf[0]);
87590e26
KP
95
96 if (ret)
97 return ret;
98
28318776 99 if (check_short_pattern(&buf[j * scanlen], scanlen, mtd->writesize, bd)) {
87590e26
KP
100 bbm->bbt[i >> 3] |= 0x03 << (i & 0x6);
101 printk(KERN_WARNING "Bad eraseblock %d at 0x%08x\n",
102 i >> 1, (unsigned int) from);
f4f91ac3 103 mtd->ecc_stats.badblocks++;
87590e26
KP
104 break;
105 }
106 }
107 i += 2;
108 from += (1 << bbm->bbt_erase_shift);
109 }
110
111 return 0;
112}
113
114
115/**
116 * onenand_memory_bbt - [GENERIC] create a memory based bad block table
117 * @param mtd MTD device structure
118 * @param bd descriptor for the good/bad block search pattern
119 *
120 * The function creates a memory based bbt by scanning the device
121 * for manufacturer / software marked good / bad blocks
122 */
123static inline int onenand_memory_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd)
124{
532a37cf 125 struct onenand_chip *this = mtd->priv;
87590e26
KP
126
127 bd->options &= ~NAND_BBT_SCANEMPTY;
532a37cf 128 return create_bbt(mtd, this->page_buf, bd, -1);
87590e26
KP
129}
130
131/**
132 * onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad
133 * @param mtd MTD device structure
134 * @param offs offset in the device
135 * @param allowbbt allow access to bad block table region
136 */
137static int onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt)
138{
139 struct onenand_chip *this = mtd->priv;
140 struct bbm_info *bbm = this->bbm;
141 int block;
142 uint8_t res;
143
144 /* Get block number * 2 */
145 block = (int) (offs >> (bbm->bbt_erase_shift - 1));
146 res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03;
147
148 DEBUG(MTD_DEBUG_LEVEL2, "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
149 (unsigned int) offs, block >> 1, res);
150
151 switch ((int) res) {
152 case 0x00: return 0;
153 case 0x01: return 1;
154 case 0x02: return allowbbt ? 0 : 1;
155 }
156
157 return 1;
158}
159
160/**
161 * onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s)
162 * @param mtd MTD device structure
163 * @param bd descriptor for the good/bad block search pattern
164 *
165 * The function checks, if a bad block table(s) is/are already
166 * available. If not it scans the device for manufacturer
167 * marked good / bad blocks and writes the bad block table(s) to
168 * the selected place.
169 *
170 * The bad block table memory is allocated here. It must be freed
171 * by calling the onenand_free_bbt function.
172 *
173 */
174int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd)
175{
176 struct onenand_chip *this = mtd->priv;
177 struct bbm_info *bbm = this->bbm;
178 int len, ret = 0;
179
180 len = mtd->size >> (this->erase_shift + 2);
181 /* Allocate memory (2bit per block) */
182 bbm->bbt = kmalloc(len, GFP_KERNEL);
183 if (!bbm->bbt) {
184 printk(KERN_ERR "onenand_scan_bbt: Out of memory\n");
185 return -ENOMEM;
186 }
187 /* Clear the memory bad block table */
188 memset(bbm->bbt, 0x00, len);
189
190 /* Set the bad block position */
191 bbm->badblockpos = ONENAND_BADBLOCK_POS;
192
193 /* Set erase shift */
194 bbm->bbt_erase_shift = this->erase_shift;
195
196 if (!bbm->isbad_bbt)
197 bbm->isbad_bbt = onenand_isbad_bbt;
198
199 /* Scan the device to build a memory based bad block table */
200 if ((ret = onenand_memory_bbt(mtd, bd))) {
201 printk(KERN_ERR "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n");
202 kfree(bbm->bbt);
203 bbm->bbt = NULL;
204 }
205
206 return ret;
207}
208
209/*
210 * Define some generic bad / good block scan pattern which are used
211 * while scanning a device for factory marked good / bad blocks.
212 */
213static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
214
215static struct nand_bbt_descr largepage_memorybased = {
216 .options = 0,
217 .offs = 0,
218 .len = 2,
219 .pattern = scan_ff_pattern,
220};
221
222/**
223 * onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device
224 * @param mtd MTD device structure
225 *
226 * This function selects the default bad block table
227 * support for the device and calls the onenand_scan_bbt function
228 */
229int onenand_default_bbt(struct mtd_info *mtd)
230{
231 struct onenand_chip *this = mtd->priv;
232 struct bbm_info *bbm;
233
234 this->bbm = kmalloc(sizeof(struct bbm_info), GFP_KERNEL);
235 if (!this->bbm)
236 return -ENOMEM;
237
238 bbm = this->bbm;
239
240 memset(bbm, 0, sizeof(struct bbm_info));
241
242 /* 1KB page has same configuration as 2KB page */
243 if (!bbm->badblock_pattern)
244 bbm->badblock_pattern = &largepage_memorybased;
245
246 return onenand_scan_bbt(mtd, bbm->badblock_pattern);
247}
248
249EXPORT_SYMBOL(onenand_scan_bbt);
250EXPORT_SYMBOL(onenand_default_bbt);